Equipment Details

Name of the EquipmentElectrochemical Capacitance Voltage (ECV) Dopant Profiler
GroupCrystalline Silicon Solar Cells
Categorysemi-clean pv
System OwnerDurga Prasad Khatri

Sreejith K P

Make / ModelWEP Control- CVP21
Serial NumberNA
FootPrint~ 60 cm x 70 cm
Equipment TypeMaterial and structural characterization tools
LocationNCPRE Fab lab (2nd Floor, NanoE Building)
AMC Not Required
Local DealerAnarghya Innovations and Technology Pvt. Ltd.

Anarghya Innovations and Technology Pvt. Ltd., # 32 (New), 7th 'A' Main Road, Muthyalanagar, Mathikere, Bangalore - 560 054, India. Tel: +91-80-23376488.
Actual DealerWEP Control

WEP Bregstr. 90 Furtwangen, Germany 78120 Phone +49-7723-9197-0 Fax +49-7723-9197-22
SOP SOP/107_SOP.pdf
Training & other policy documents
Glimpse GLIMPSE/107_GLIMPSE.pdf
Tool Facilities RequirementsCDA
Lab Phone No4489 Ext Flash 1
Substrate allowedPhosphorus / Boron Diffused Si samples
Substrate DimensionPreferably more than 2 cm x 2 cm
Chemical allowedNA, Need to present the process flow in the NCPRE Si group meeting to get permission for process requests.
Precursors/ Targets available
*Based on stock availability
Precursor/ Target loaded inside tool1
Target dimensionNA
Gases allowedNA
Contamination remarksDestructive Method ! Samples may be Na or K contaminated.