Equipment Details

Name of the EquipmentLifetime Characterization and Suns Voc Measurement System
GroupCrystalline Silicon Solar Cells
System OwnerSuren Patwardhan

Swasti Bhatia

Make / ModelSinton/WCT-120
InformationReports lifetime and surface recombination properties as a function of carrier density in the sample
Serial Number110-126358
FootPrint4feet X 4.5feet
Equipment TypeMaterial and structural characterization tools
LocationNCPRE Char lab (3rd Floor, NanoE Building)
AMC Required
Local DealerNA

Actual DealerSinton Instruments

1.Bob Sinton Sinton Instruments 4720 Walnut St. Suite 102 Boulder, CO 80301 USA +1. 303.945.2474 2. James Swirhun Application Engineer 3.Andrienne L. Blum Application Engineer
SOP SOP/60_SOP.pdf
Training & other policy documentsPOLICY/60_POLICY.pdf
Glimpse GLIMPSE/60_GLIMPSE.pdf
Tool Facilities RequirementsNA
Lab Phone No4489 Ext Flash
Substrate allowedProcessed silicon wafer without metallization for lifetime tester and with backside metallization for Suns Voc
Substrate DimensionMin 2
Chemical allowedNA, Processed silicon wafer
Precursors/ Targets available
*Based on stock availability
Precursor/ Target loaded inside toolNA
Target dimensionNA
Gases allowedNA
Contamination remarksProcessed samples will be considered as Na and K conaminated. Because of brass chuck and contacts, there can be contamination during Suns Voc measurement.